BibTeX record conf/iisa/TziolasTPRDTP22

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@inproceedings{DBLP:conf/iisa/TziolasTPRDTP22,
  author       = {Theodoros Tziolas and
                  Theodosis Theodosiou and
                  Konstantinos Papageorgiou and
                  Aikaterini Rapti and
                  Nikolaos Dimitriou and
                  Dimitrios Tzovaras and
                  Elpiniki Papageorgiou},
  editor       = {Nikolaos G. Bourbakis and
                  George A. Tsihrintzis and
                  Maria Virvou},
  title        = {Wafer Map Defect Pattern Recognition using Imbalanced Datasets},
  booktitle    = {13th International Conference on Information, Intelligence, Systems
                  {\&} Applications, {IISA} 2022, Corfu, Greece, July 18-20, 2022},
  pages        = {1--8},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/IISA56318.2022.9904402},
  doi          = {10.1109/IISA56318.2022.9904402},
  timestamp    = {Tue, 21 Mar 2023 20:59:22 +0100},
  biburl       = {https://dblp.org/rec/conf/iisa/TziolasTPRDTP22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}