BibTeX record conf/iiaiaai/KawaguchiMWIIU23

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@inproceedings{DBLP:conf/iiaiaai/KawaguchiMWIIU23,
  author       = {Masashi Kawaguchi and
                  Yuta Morimitsu and
                  Ryusei Watanabe and
                  Chihiro Ikuta and
                  Naohiro Ishii and
                  Masayoshi Umeno},
  title        = {Fabric Defect Detection System using {YOLO}},
  booktitle    = {14th {IIAI} International Congress on Advanced Applied Informatics,
                  {IIAI-AAI} 2023, Koriyama, Japan, July 8-13, 2023},
  pages        = {277--280},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/IIAI-AAI59060.2023.00062},
  doi          = {10.1109/IIAI-AAI59060.2023.00062},
  timestamp    = {Thu, 18 Jan 2024 08:27:12 +0100},
  biburl       = {https://dblp.org/rec/conf/iiaiaai/KawaguchiMWIIU23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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