BibTeX record conf/ifm/HoomanMW12

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@inproceedings{DBLP:conf/ifm/HoomanMW12,
  author       = {Jozef Hooman and
                  Arjan J. Mooij and
                  Hans van Wezep},
  editor       = {John Derrick and
                  Stefania Gnesi and
                  Diego Latella and
                  Helen Treharne},
  title        = {Early Fault Detection in Industry Using Models at Various Abstraction
                  Levels},
  booktitle    = {Integrated Formal Methods - 9th International Conference, {IFM} 2012,
                  Pisa, Italy, June 18-21, 2012. Proceedings},
  series       = {Lecture Notes in Computer Science},
  volume       = {7321},
  pages        = {268--282},
  publisher    = {Springer},
  year         = {2012},
  url          = {https://doi.org/10.1007/978-3-642-30729-4\_19},
  doi          = {10.1007/978-3-642-30729-4\_19},
  timestamp    = {Tue, 14 May 2019 10:00:51 +0200},
  biburl       = {https://dblp.org/rec/conf/ifm/HoomanMW12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}