BibTeX record conf/ieem/NavasPRA18

download as .bib file

@inproceedings{DBLP:conf/ieem/NavasPRA18,
  author       = {R. Kaja Bantha Navas and
                  S. Prakash and
                  A. John Rajan and
                  Subramaniam Arunachalam},
  title        = {Total Quality Management: {A} Framework for Quality Improvement in
                  Indian Manufacturing Small and Medium Enterprises},
  booktitle    = {2018 {IEEE} International Conference on Industrial Engineering and
                  Engineering Management, {IEEM} 2018, Bangkok, Thailand, December 16-19,
                  2018},
  pages        = {597--601},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IEEM.2018.8607781},
  doi          = {10.1109/IEEM.2018.8607781},
  timestamp    = {Sun, 02 Oct 2022 16:07:28 +0200},
  biburl       = {https://dblp.org/rec/conf/ieem/NavasPRA18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.