BibTeX record conf/ieem/BlattlerSTCS23

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@inproceedings{DBLP:conf/ieem/BlattlerSTCS23,
  author       = {Aran Blattler and
                  Teppakorn Sittiwanchai and
                  Patipan Tareram and
                  Worraphong Chenvigyakit and
                  Chanatep Sila{-}ars},
  title        = {One-Shot Grading: Design and Development of an Automatic Answer Sheet
                  Checker},
  booktitle    = {{IEEE} International Conference on Industrial Engineering and Engineering
                  Management, {IEEM} 2023, Singapore, December 18-21, 2023},
  pages        = {562--566},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/IEEM58616.2023.10406437},
  doi          = {10.1109/IEEM58616.2023.10406437},
  timestamp    = {Mon, 29 Apr 2024 21:26:33 +0200},
  biburl       = {https://dblp.org/rec/conf/ieem/BlattlerSTCS23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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