BibTeX record conf/ieeevast/DennigPLSP019

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@inproceedings{DBLP:conf/ieeevast/DennigPLSP019,
  author       = {Frederik L. Dennig and
                  Tom Polk and
                  Zudi Lin and
                  Tobias Schreck and
                  Hanspeter Pfister and
                  Michael Behrisch},
  editor       = {Remco Chang and
                  Daniel A. Keim and
                  Ross Maciejewski},
  title        = {FDive: Learning Relevance Models Using Pattern-based Similarity Measures},
  booktitle    = {14th {IEEE} Conference on Visual Analytics Science and Technology,
                  {IEEE} {VAST} 2019, Vancouver, BC, Canada, October 20-25, 2019},
  pages        = {69--80},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/VAST47406.2019.8986940},
  doi          = {10.1109/VAST47406.2019.8986940},
  timestamp    = {Tue, 21 Mar 2023 20:55:16 +0100},
  biburl       = {https://dblp.org/rec/conf/ieeevast/DennigPLSP019.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}