BibTeX record conf/ieeesensors/SimicAB22

download as .bib file

@inproceedings{DBLP:conf/ieeesensors/SimicAB22,
  author       = {Marko Simic and
                  Davorin Ambrus and
                  Vedran Bilas},
  title        = {Object Depth Estimation From Line-Scan {EMI} Data Using Machine Learning},
  booktitle    = {2022 {IEEE} Sensors, Dallas, TX, USA, October 30 - Nov. 2, 2022},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/SENSORS52175.2022.9967098},
  doi          = {10.1109/SENSORS52175.2022.9967098},
  timestamp    = {Tue, 13 Dec 2022 13:54:18 +0100},
  biburl       = {https://dblp.org/rec/conf/ieeesensors/SimicAB22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.