BibTeX record conf/iecon/WangYR20

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@inproceedings{DBLP:conf/iecon/WangYR20,
  author       = {Jun Wang and
                  Xibo Yuan and
                  Navid Rasekh},
  title        = {Triple Pulse Test {(TPT)} for Characterizing Power Loss in Magnetic
                  Components in Analogous to Double Pulse Test {(DPT)} for Power Electronics
                  Devices},
  booktitle    = {The 46th Annual Conference of the {IEEE} Industrial Electronics Society,
                  {IECON} 2020, Singapore, October 18-21, 2020},
  pages        = {4717--4724},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/IECON43393.2020.9255039},
  doi          = {10.1109/IECON43393.2020.9255039},
  timestamp    = {Wed, 22 Dec 2021 16:38:03 +0100},
  biburl       = {https://dblp.org/rec/conf/iecon/WangYR20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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