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BibTeX record conf/iecon/WangYR20
@inproceedings{DBLP:conf/iecon/WangYR20, author = {Jun Wang and Xibo Yuan and Navid Rasekh}, title = {Triple Pulse Test {(TPT)} for Characterizing Power Loss in Magnetic Components in Analogous to Double Pulse Test {(DPT)} for Power Electronics Devices}, booktitle = {The 46th Annual Conference of the {IEEE} Industrial Electronics Society, {IECON} 2020, Singapore, October 18-21, 2020}, pages = {4717--4724}, publisher = {{IEEE}}, year = {2020}, url = {https://doi.org/10.1109/IECON43393.2020.9255039}, doi = {10.1109/IECON43393.2020.9255039}, timestamp = {Wed, 22 Dec 2021 16:38:03 +0100}, biburl = {https://dblp.org/rec/conf/iecon/WangYR20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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