BibTeX record conf/iecon/RacitiRSSSSMA18

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@inproceedings{DBLP:conf/iecon/RacitiRSSSSMA18,
  author       = {Angelo Raciti and
                  Santi Agatino Rizzo and
                  Nunzio Salerno and
                  Giovanni Susinni and
                  Rosario Scollo and
                  Alfio Scuto and
                  Salvatore Musumeci and
                  Eric Armando},
  title        = {Modeling of the Power Losses due to Coss in {SJ} MOSFETs Submitted
                  to {ZVS:} Identification of the Passive Parameters by a Genetic Algorithm},
  booktitle    = {{IECON} 2018 - 44th Annual Conference of the {IEEE} Industrial Electronics
                  Society, Washington, DC, USA, October 21-23, 2018},
  pages        = {1321--1326},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IECON.2018.8592683},
  doi          = {10.1109/IECON.2018.8592683},
  timestamp    = {Sat, 30 Sep 2023 09:47:34 +0200},
  biburl       = {https://dblp.org/rec/conf/iecon/RacitiRSSSSMA18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}