BibTeX record conf/iecon/NuanprasertBS15

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@inproceedings{DBLP:conf/iecon/NuanprasertBS15,
  author       = {Somchai Nuanprasert and
                  Sueki Baba and
                  Takashi Suzuki},
  title        = {An efficient method of occluded solder ball segmentation for automated
                  {BGA} void defect inspection using X-ray images},
  booktitle    = {{IECON} 2015 - 41st Annual Conference of the {IEEE} Industrial Electronics
                  Society, Yokohama, Japan, November 9-12, 2015},
  pages        = {3308--3313},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IECON.2015.7392610},
  doi          = {10.1109/IECON.2015.7392610},
  timestamp    = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl       = {https://dblp.org/rec/conf/iecon/NuanprasertBS15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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