BibTeX record conf/iecon/MoonJK16

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@inproceedings{DBLP:conf/iecon/MoonJK16,
  author       = {Seokbae Moon and
                  Hyeyun Jeong and
                  Sang Woo Kim},
  title        = {Interturn short fault diagnosis of a {PMSM} using voltage residual
                  components},
  booktitle    = {{IECON} 2016 - 42nd Annual Conference of the {IEEE} Industrial Electronics
                  Society, Florence, Italy, October 23-26, 2016},
  pages        = {1513--1517},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/IECON.2016.7793572},
  doi          = {10.1109/IECON.2016.7793572},
  timestamp    = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl       = {https://dblp.org/rec/conf/iecon/MoonJK16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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