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BibTeX record conf/iecon/LiXLHZL23
@inproceedings{DBLP:conf/iecon/LiXLHZL23, author = {Weiguo Li and Yunfei Xu and Qingping Li and Yi Hao and Guoliang Zhao and Haijun Liu}, title = {Behavior Modeling and Analysis of High-Voltage SiC {MOSFET} Considering Temperature Effect}, booktitle = {49th Annual Conference of the {IEEE} Industrial Electronics Society, {IECON} 2023, Singapore, October 16-19, 2023}, pages = {1--7}, publisher = {{IEEE}}, year = {2023}, url = {https://doi.org/10.1109/IECON51785.2023.10311758}, doi = {10.1109/IECON51785.2023.10311758}, timestamp = {Sat, 25 Nov 2023 16:52:31 +0100}, biburl = {https://dblp.org/rec/conf/iecon/LiXLHZL23.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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