BibTeX record conf/iecon/LachichiM21

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@inproceedings{DBLP:conf/iecon/LachichiM21,
  author       = {Amel Lachichi and
                  Phil Mawby},
  title        = {Bipolar Degradation monitoring of 4H-SiC {MOSFET} Power Devices by
                  Electroluminescence Measurements},
  booktitle    = {{IECON} 2021 - 47th Annual Conference of the {IEEE} Industrial Electronics
                  Society, Toronto, ON, Canada, October 13-16, 2021},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/IECON48115.2021.9589563},
  doi          = {10.1109/IECON48115.2021.9589563},
  timestamp    = {Wed, 17 Nov 2021 15:21:55 +0100},
  biburl       = {https://dblp.org/rec/conf/iecon/LachichiM21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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