BibTeX record conf/iecon/Diaz-SaldanaOCT22

• > Home > conf/iecon/Diaz-SaldanaOCT22

@inproceedings{DBLP:conf/iecon/Diaz-SaldanaOCT22,
  author       = {Geovanni Diaz{-}Salda{\~{n}}a and
                  Roque Alfredo Osornio{-}Rios and
                  Irving Armando Cruz{-}Albarr{\'{a}}n and
                  Miguel Trejo{-}Hernandez and
                  Jose A. Antonino{-}Daviu},
  title        = {{CNC} lathe tool wear analysis using image processing and stray flux},
  booktitle    = {{IECON} 2022 - 48th Annual Conference of the {IEEE} Industrial Electronics
                  Society, Brussels, Belgium, October 17-20, 2022},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/IECON49645.2022.9968684},
  doi          = {10.1109/IECON49645.2022.9968684},
  timestamp    = {Wed, 04 Jan 2023 16:48:33 +0100},
  biburl       = {https://dblp.org/rec/conf/iecon/Diaz-SaldanaOCT22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}