BibTeX record conf/iecon/DialloD17

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@inproceedings{DBLP:conf/iecon/DialloD17,
  author       = {Demba Diallo and
                  Claude Delpha},
  title        = {Incipient offset current sensor fault detection and diagnosis using
                  statistical analysis and the Kullback Leibler divergence for {AC}
                  drive},
  booktitle    = {{IECON} 2017 - 43rd Annual Conference of the {IEEE} Industrial Electronics
                  Society, Beijing, China, October 29 - November 1, 2017},
  pages        = {8070--8075},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/IECON.2017.8217416},
  doi          = {10.1109/IECON.2017.8217416},
  timestamp    = {Tue, 21 Mar 2023 20:51:54 +0100},
  biburl       = {https://dblp.org/rec/conf/iecon/DialloD17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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