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BibTeX record conf/iecon/BrandeleroCMV13
@inproceedings{DBLP:conf/iecon/BrandeleroCMV13, author = {Julio Brandelero and Bernardo Cougo and Thierry Meynard and Nicolas Videau}, title = {A non-intrusive method for measuring switching losses of GaN power transistors}, booktitle = {{IECON} 2013 - 39th Annual Conference of the {IEEE} Industrial Electronics Society, Vienna, Austria, November 10-13, 2013}, pages = {246--251}, publisher = {{IEEE}}, year = {2013}, url = {https://doi.org/10.1109/IECON.2013.6699143}, doi = {10.1109/IECON.2013.6699143}, timestamp = {Mon, 09 Aug 2021 14:54:01 +0200}, biburl = {https://dblp.org/rec/conf/iecon/BrandeleroCMV13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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