BibTeX record conf/iecon/BhandiaCCP18

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@inproceedings{DBLP:conf/iecon/BhandiaCCP18,
  author       = {Rishabh Bhandia and
                  Jose J. Chavez and
                  Milos Cvetkovic and
                  Peter Palensky},
  title        = {High Impedance Fault Detection in Real-Time and Evaluation Using Hardware-In-Loop
                  Testing},
  booktitle    = {{IECON} 2018 - 44th Annual Conference of the {IEEE} Industrial Electronics
                  Society, Washington, DC, USA, October 21-23, 2018},
  pages        = {182--187},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IECON.2018.8591824},
  doi          = {10.1109/IECON.2018.8591824},
  timestamp    = {Sun, 25 Oct 2020 23:01:44 +0100},
  biburl       = {https://dblp.org/rec/conf/iecon/BhandiaCCP18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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