BibTeX record conf/iecc/WanYDL23

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@inproceedings{DBLP:conf/iecc/WanYDL23,
  author       = {Jianbiao Wan and
                  Kar Peo Yar and
                  Chunling Du and
                  Malcolm Yoke Hean Low},
  title        = {Sensor Data Analytics for Tool Condition Anomaly Detection with Machine
                  Learning Techniques},
  booktitle    = {Proceedings of the 2023 5th International Electronics Communication
                  Conference, {IECC} 2023, Osaka City, Japan, July 21-23, 2023},
  pages        = {38--45},
  publisher    = {{ACM}},
  year         = {2023},
  url          = {https://doi.org/10.1145/3616480.3616486},
  doi          = {10.1145/3616480.3616486},
  timestamp    = {Thu, 09 Nov 2023 21:13:03 +0100},
  biburl       = {https://dblp.org/rec/conf/iecc/WanYDL23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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