BibTeX record conf/ieaaie/SaeedPR20

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@inproceedings{DBLP:conf/ieaaie/SaeedPR20,
  author       = {Faisal Saeed and
                  Anand Paul and
                  Seungmin Rho},
  editor       = {Hamido Fujita and
                  Philippe Fournier{-}Viger and
                  Moonis Ali and
                  Jun Sasaki},
  title        = {Faster {R-CNN} Based Fault Detection in Industrial Images},
  booktitle    = {Trends in Artificial Intelligence Theory and Applications. Artificial
                  Intelligence Practices - 33rd International Conference on Industrial,
                  Engineering and Other Applications of Applied Intelligent Systems,
                  {IEA/AIE} 2020, Kitakyushu, Japan, September 22-25, 2020, Proceedings},
  series       = {Lecture Notes in Computer Science},
  volume       = {12144},
  pages        = {280--287},
  publisher    = {Springer},
  year         = {2020},
  url          = {https://doi.org/10.1007/978-3-030-55789-8\_25},
  doi          = {10.1007/978-3-030-55789-8\_25},
  timestamp    = {Thu, 22 Oct 2020 10:46:29 +0200},
  biburl       = {https://dblp.org/rec/conf/ieaaie/SaeedPR20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}