Binary Decision Tree Using K-means and Genetic Algorithm for Recognizing Defect Patterns of Cold Mill Strip.

Kyoung Min Kim Joong Jo Park Myung Hyun Song In-Cheol Kim Ching Y. Suen Binary Decision Tree Using K-means and Genetic Algorithm for Recognizing Defect Patterns of Cold Mill Strip. 341-350 http://springerlink.metapress.com/openurl.asp?genre=article&issn=0302-9743&volume=3029&spage=341 2004 conf/ieaaie/2004 IEA/AIE db/conf/ieaaie/ieaaie2004.html#KimPSKS04