A Novel Manufacturing Defect Detection Method Using Data Mining Approach.

Wei-Chou Chen Shian-Shyong Tseng Ching-Yao Wang A Novel Manufacturing Defect Detection Method Using Data Mining Approach. 77-86 http://springerlink.metapress.com/openurl.asp?genre=article&issn=0302-9743&volume=3029&spage=77 2004 conf/ieaaie/2004 IEA/AIE db/conf/ieaaie/ieaaie2004.html#ChenTW04