BibTeX record conf/idt/ChenoufDBTG14

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@inproceedings{DBLP:conf/idt/ChenoufDBTG14,
  author       = {Amel Chenouf and
                  Boualem Djezzar and
                  Abdelmadjid Benabdelmoumene and
                  Hakim Tahi and
                  Mohamed Goudjil},
  title        = {Reliability analysis of {CMOS} inverter subjected to {AC} {\&}
                  {DC} {NBTI} stresses},
  booktitle    = {9th International Design and Test Symposium, {IDT} 2014, Algeries,
                  Algeria, December 16-18, 2014},
  pages        = {142--146},
  publisher    = {{IEEE}},
  year         = {2014},
  url          = {https://doi.org/10.1109/IDT.2014.7038602},
  doi          = {10.1109/IDT.2014.7038602},
  timestamp    = {Sun, 25 Oct 2020 23:16:08 +0100},
  biburl       = {https://dblp.org/rec/conf/idt/ChenoufDBTG14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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