Binary Nonnegative Matrix Factorization Applied to Semi-conductor Wafer Test Sets.

Reinhard Schachtner Gerhard Pöppel Elmar Wolfgang Lang Binary Nonnegative Matrix Factorization Applied to Semi-conductor Wafer Test Sets. 710-717 2009 ICA http://dx.doi.org/10.1007/978-3-642-00599-2_89 conf/ida/2009 db/conf/ida/ida2009.html#SchachtnerPL09