Tian Chen Huaguo Liang Minsheng Zhang Wei Wang A Scheme of Test Pattern Generation Based on Reseeding of Segment-Fixing Counter. 2272-2277 2008 ICYCS http://dx.doi.org/10.1109/ICYCS.2008.216 conf/icycs/2008 db/conf/icycs/icycs2008.html#ChenLZW08