BibTeX record conf/icvgip/KarmakarBGS022

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@inproceedings{DBLP:conf/icvgip/KarmakarBGS022,
  author       = {Soumyajit Karmakar and
                  Abeer Banerjee and
                  Prashant Sadashiv Gidde and
                  Sumeet Saurav and
                  Sanjay Singh},
  editor       = {Soma Biswas and
                  Shanmuganathan Raman and
                  Amit K. Roy{-}Chowdhury},
  title        = {Convolutional Ensembling based Few-Shot Defect Detection Technique},
  booktitle    = {Proceedings of the Thirteenth Indian Conference on Computer Vision,
                  Graphics and Image Processing, {ICVGIP} 2022, Gandhinagar, India,
                  December 8-10, 2022},
  pages        = {6:1--6:7},
  publisher    = {{ACM}},
  year         = {2022},
  url          = {https://doi.org/10.1145/3571600.3571607},
  doi          = {10.1145/3571600.3571607},
  timestamp    = {Tue, 30 Jan 2024 13:25:57 +0100},
  biburl       = {https://dblp.org/rec/conf/icvgip/KarmakarBGS022.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}