BibTeX record conf/ictai/LuCK03

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@inproceedings{DBLP:conf/ictai/LuCK03,
  author       = {Chang{-}Tien Lu and
                  Dechang Chen and
                  Yufeng Kou},
  title        = {Detecting Spatial Outliers with Multiple Attributes},
  booktitle    = {15th {IEEE} International Conference on Tools with Artificial Intelligence
                  {(ICTAI} 2003), 3-5 November 2003, Sacramento, California, {USA}},
  pages        = {122--128},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/TAI.2003.1250179},
  doi          = {10.1109/TAI.2003.1250179},
  timestamp    = {Fri, 24 Mar 2023 00:04:32 +0100},
  biburl       = {https://dblp.org/rec/conf/ictai/LuCK03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}