BibTeX record conf/icta3/YangXHZ021

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@inproceedings{DBLP:conf/icta3/YangXHZ021,
  author       = {Zixuan Yang and
                  Qian Xie and
                  Qiao He and
                  Meng Zhao and
                  Zheng Wang},
  title        = {A New Method to Extract Mobility Degradation and Parasitic Series
                  Resistance of Nano-scaled MOSFETs},
  booktitle    = {2021 {IEEE} International Conference on Integrated Circuits, Technologies
                  and Applications, {ICTA} 2021, Zhuhai, China, November 24-26, 2021},
  pages        = {99--100},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/ICTA53157.2021.9661623},
  doi          = {10.1109/ICTA53157.2021.9661623},
  timestamp    = {Mon, 06 Nov 2023 08:21:04 +0100},
  biburl       = {https://dblp.org/rec/conf/icta3/YangXHZ021.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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