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BibTeX record conf/icst/Oh0Y21
@inproceedings{DBLP:conf/icst/Oh0Y21, author = {Saeyoon Oh and Seongmin Lee and Shin Yoo}, title = {Effectively Sampling Higher Order Mutants Using Causal Effect}, booktitle = {14th {IEEE} International Conference on Software Testing, Verification and Validation Workshops, {ICST} Workshops 2021, Porto de Galinhas, Brazil, April 12-16, 2021}, pages = {19--24}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/ICSTW52544.2021.00017}, doi = {10.1109/ICSTW52544.2021.00017}, timestamp = {Tue, 07 May 2024 20:09:44 +0200}, biburl = {https://dblp.org/rec/conf/icst/Oh0Y21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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