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BibTeX record conf/icst/LacknerTWW14
@inproceedings{DBLP:conf/icst/LacknerTWW14, author = {Hartmut Lackner and Martin Thomas and Florian Wartenberg and Stephan Wei{\ss}leder}, title = {Model-Based Test Design of Product Lines: Raising Test Design to the Product Line Level}, booktitle = {Seventh {IEEE} International Conference on Software Testing, Verification and Validation, {ICST} 2014, March 31 2014-April 4, 2014, Cleveland, Ohio, {USA}}, pages = {51--60}, publisher = {{IEEE} Computer Society}, year = {2014}, url = {https://doi.org/10.1109/ICST.2014.16}, doi = {10.1109/ICST.2014.16}, timestamp = {Thu, 23 Mar 2023 23:58:21 +0100}, biburl = {https://dblp.org/rec/conf/icst/LacknerTWW14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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