BibTeX record conf/icst/KimPY23

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@inproceedings{DBLP:conf/icst/KimPY23,
  author       = {Jinhan Kim and
                  Jongchan Park and
                  Shin Yoo},
  title        = {The Inversive Relationship Between Bugs and Patches: An Empirical
                  Study},
  booktitle    = {{IEEE} International Conference on Software Testing, Verification
                  and Validation, {ICST} 2023 - Workshops, Dublin, Ireland, April 16-20,
                  2023},
  pages        = {314--323},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/ICSTW58534.2023.00062},
  doi          = {10.1109/ICSTW58534.2023.00062},
  timestamp    = {Wed, 07 Jun 2023 22:08:04 +0200},
  biburl       = {https://dblp.org/rec/conf/icst/KimPY23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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