BibTeX record conf/icst/KimKL22

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@inproceedings{DBLP:conf/icst/KimKL22,
  author       = {Misoo Kim and
                  Youngkyoung Kim and
                  Eunseok Lee},
  title        = {An Empirical Study of IR-based Bug Localization for Deep Learning-based
                  Software},
  booktitle    = {15th {IEEE} Conference on Software Testing, Verification and Validation,
                  {ICST} 2022, Valencia, Spain, April 4-14, 2022},
  pages        = {128--139},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ICST53961.2022.00024},
  doi          = {10.1109/ICST53961.2022.00024},
  timestamp    = {Tue, 08 Aug 2023 11:41:50 +0200},
  biburl       = {https://dblp.org/rec/conf/icst/KimKL22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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