BibTeX record conf/icst/KimJJO23

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@inproceedings{DBLP:conf/icst/KimJJO23,
  author       = {Jinkook Kim and
                  Minseok Jeon and
                  Sejeong Jang and
                  Hakjoo Oh},
  title        = {Automating Endurance Test for Flash-based Storage Devices in Samsung
                  Electronics},
  booktitle    = {{IEEE} Conference on Software Testing, Verification and Validation,
                  {ICST} 2023, Dublin, Ireland, April 16-20, 2023},
  pages        = {317--326},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/ICST57152.2023.00037},
  doi          = {10.1109/ICST57152.2023.00037},
  timestamp    = {Thu, 01 Jun 2023 13:31:05 +0200},
  biburl       = {https://dblp.org/rec/conf/icst/KimJJO23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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