BibTeX record conf/icst/BalfroidLVD23

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@inproceedings{DBLP:conf/icst/BalfroidLVD23,
  author       = {Martin Balfroid and
                  Pierre Luycx and
                  Beno{\^{\i}}t Vanderose and
                  Xavier Devroey},
  title        = {An Empirical Evaluation of Regular and Extreme Mutation Testing for
                  Teaching Software Testing},
  booktitle    = {{IEEE} International Conference on Software Testing, Verification
                  and Validation, {ICST} 2023 - Workshops, Dublin, Ireland, April 16-20,
                  2023},
  pages        = {405--412},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/ICSTW58534.2023.00074},
  doi          = {10.1109/ICSTW58534.2023.00074},
  timestamp    = {Mon, 26 Jun 2023 20:42:21 +0200},
  biburl       = {https://dblp.org/rec/conf/icst/BalfroidLVD23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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