BibTeX record conf/icspcc/ZhangWZLHLL22

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@inproceedings{DBLP:conf/icspcc/ZhangWZLHLL22,
  author       = {Yue Zhang and
                  Baoguo Wei and
                  Lina Zhao and
                  Jinwei Liu and
                  Zhilang Hao and
                  Lixin Li and
                  Xu Li},
  title        = {Insulator Defect Detection Based on Feature Fusion and Attention Mechanism},
  booktitle    = {{IEEE} International Conference on Signal Processing, Communications
                  and Computing, {ICSPCC} 2022, Xi'an, China, October 25-27, 2022},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ICSPCC55723.2022.9984418},
  doi          = {10.1109/ICSPCC55723.2022.9984418},
  timestamp    = {Wed, 04 Jan 2023 16:48:29 +0100},
  biburl       = {https://dblp.org/rec/conf/icspcc/ZhangWZLHLL22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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