BibTeX record conf/icse/ParryKHM20

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@inproceedings{DBLP:conf/icse/ParryKHM20,
  author       = {Owain Parry and
                  Gregory M. Kapfhammer and
                  Michael Hilton and
                  Phil McMinn},
  title        = {Flake It 'Till You Make It: Using Automated Repair to Induce and Fix
                  Latent Test Flakiness},
  booktitle    = {{ICSE} '20: 42nd International Conference on Software Engineering,
                  Workshops, Seoul, Republic of Korea, 27 June - 19 July, 2020},
  pages        = {11--12},
  publisher    = {{ACM}},
  year         = {2020},
  url          = {https://doi.org/10.1145/3387940.3392177},
  doi          = {10.1145/3387940.3392177},
  timestamp    = {Fri, 16 Oct 2020 11:30:56 +0200},
  biburl       = {https://dblp.org/rec/conf/icse/ParryKHM20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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