BibTeX record conf/icse/KlasEMHG10

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@inproceedings{DBLP:conf/icse/KlasEMHG10,
  author       = {Michael Kl{\"{a}}s and
                  Frank Elberzhager and
                  J{\"{u}}rgen M{\"{u}}nch and
                  Klaus Hartjes and
                  Olaf von Graevemeyer},
  editor       = {Jeff Kramer and
                  Judith Bishop and
                  Premkumar T. Devanbu and
                  Sebasti{\'{a}}n Uchitel},
  title        = {Transparent combination of expert and measurement data for defect
                  prediction: an industrial case study},
  booktitle    = {Proceedings of the 32nd {ACM/IEEE} International Conference on Software
                  Engineering - Volume 2, {ICSE} 2010, Cape Town, South Africa, 1-8
                  May 2010},
  pages        = {119--128},
  publisher    = {{ACM}},
  year         = {2010},
  url          = {https://doi.org/10.1145/1810295.1810313},
  doi          = {10.1145/1810295.1810313},
  timestamp    = {Sat, 19 Oct 2019 20:20:04 +0200},
  biburl       = {https://dblp.org/rec/conf/icse/KlasEMHG10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}