BibTeX record conf/icse-met/TorikoshiNT23

download as .bib file

@inproceedings{DBLP:conf/icse-met/TorikoshiNT23,
  author       = {Yuma Torikoshi and
                  Yasuharu Nishi and
                  Juichi Takahashi},
  title        = {Sensitive Region-Based Metamorphic Testing Framework using Explainable
                  {AI}},
  booktitle    = {8th {IEEE/ACM} International Workshop on Metamorphic Testing, MET@ICSE
                  2023, Melbourne, Australia, May 14, 2023},
  pages        = {25--30},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/MET59151.2023.00011},
  doi          = {10.1109/MET59151.2023.00011},
  timestamp    = {Wed, 09 Aug 2023 16:25:11 +0200},
  biburl       = {https://dblp.org/rec/conf/icse-met/TorikoshiNT23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.