BibTeX record conf/icsc2/ChakarounDOP15

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@inproceedings{DBLP:conf/icsc2/ChakarounDOP15,
  author       = {Mohamad Chakaroun and
                  Mohand Djeziri and
                  Mustapha Ouladsine and
                  Jacques Pinaton},
  title        = {Defect diagnosis using in line product control data in semiconductor
                  industry},
  booktitle    = {4th International Conference on Systems and Control, {ICSC} 2015,
                  Sousse, Tunisia, April 28-30, 2015},
  pages        = {212--217},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/ICoSC.2015.7152764},
  doi          = {10.1109/ICOSC.2015.7152764},
  timestamp    = {Mon, 29 Aug 2022 17:17:29 +0200},
  biburl       = {https://dblp.org/rec/conf/icsc2/ChakarounDOP15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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