BibTeX record conf/icpr/OzdemirBMEE98

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@inproceedings{DBLP:conf/icpr/OzdemirBMEE98,
  author       = {Serhat {\"{O}}zdemir and
                  Alper Baykut and
                  Rusen Meylani and
                  Ayt{\"{u}}l Er{\c{c}}il and
                  Aysin Ert{\"{u}}z{\"{u}}n},
  editor       = {Anil K. Jain and
                  Svetha Venkatesh and
                  Brian C. Lovell},
  title        = {Comparative evaluation of texture analysis algorithms for defect inspection
                  of textile products},
  booktitle    = {Fourteenth International Conference on Pattern Recognition, {ICPR}
                  1998, Brisbane, Australia, 16-20 August, 1998},
  pages        = {1738--1740},
  publisher    = {{IEEE} Computer Society},
  year         = {1998},
  url          = {https://doi.org/10.1109/ICPR.1998.712061},
  doi          = {10.1109/ICPR.1998.712061},
  timestamp    = {Fri, 24 Mar 2023 00:03:28 +0100},
  biburl       = {https://dblp.org/rec/conf/icpr/OzdemirBMEE98.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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