L. R. Van den Doel Lucas J. van Vliet K. T. Hjelt M. J. Vellekoop Ian T. Young F. Gromball Jan G. Korvink Nanometer-Scale Height Measurements in Micromachined Picoliter Vials Based on Interference Fringe Analysis. 3057-3062 2000 ICPR http://csdl.computer.org/comp/proceedings/icpr/2000/0750/03/07503057abs.htm db/conf/icpr/icpr2000-3.html#DoelVHVYGK00