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BibTeX record conf/icnsc/GaoG020
@inproceedings{DBLP:conf/icnsc/GaoG020, author = {Yiping Gao and Liang Gao and Xinyu Li}, title = {A New Semi-Supervised Deep Learning Approach for Intelligent Defects Recognition}, booktitle = {{IEEE} International Conference on Networking, Sensing and Control, {ICNSC} 2020, Nanjing, China, October 30 - November 2, 2020}, pages = {1--4}, publisher = {{IEEE}}, year = {2020}, url = {https://doi.org/10.1109/ICNSC48988.2020.9238100}, doi = {10.1109/ICNSC48988.2020.9238100}, timestamp = {Tue, 24 Nov 2020 08:30:52 +0100}, biburl = {https://dblp.org/rec/conf/icnsc/GaoG020.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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