BibTeX record conf/icmla/SunTBOJB22

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@inproceedings{DBLP:conf/icmla/SunTBOJB22,
  author       = {Chenwei Sun and
                  Martin Trat and
                  Janek Bender and
                  Jivka Ovtcharova and
                  George Jeppesen and
                  Jan B{\"{a}}r},
  editor       = {M. Arif Wani and
                  Mehmed M. Kantardzic and
                  Vasile Palade and
                  Daniel Neagu and
                  Longzhi Yang and
                  Kit Yan Chan},
  title        = {Unsupervised Anomaly Detection and Root Cause Analysis for an Industrial
                  Press Machine based on Skip-Connected Autoencoder},
  booktitle    = {21st {IEEE} International Conference on Machine Learning and Applications,
                  {ICMLA} 2022, Nassau, Bahamas, December 12-14, 2022},
  pages        = {681--686},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ICMLA55696.2022.00113},
  doi          = {10.1109/ICMLA55696.2022.00113},
  timestamp    = {Sun, 06 Oct 2024 21:06:00 +0200},
  biburl       = {https://dblp.org/rec/conf/icmla/SunTBOJB22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}