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BibTeX record conf/icmla/SunTBOJB22
@inproceedings{DBLP:conf/icmla/SunTBOJB22, author = {Chenwei Sun and Martin Trat and Janek Bender and Jivka Ovtcharova and George Jeppesen and Jan B{\"{a}}r}, editor = {M. Arif Wani and Mehmed M. Kantardzic and Vasile Palade and Daniel Neagu and Longzhi Yang and Kit Yan Chan}, title = {Unsupervised Anomaly Detection and Root Cause Analysis for an Industrial Press Machine based on Skip-Connected Autoencoder}, booktitle = {21st {IEEE} International Conference on Machine Learning and Applications, {ICMLA} 2022, Nassau, Bahamas, December 12-14, 2022}, pages = {681--686}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/ICMLA55696.2022.00113}, doi = {10.1109/ICMLA55696.2022.00113}, timestamp = {Sun, 06 Oct 2024 21:06:00 +0200}, biburl = {https://dblp.org/rec/conf/icmla/SunTBOJB22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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