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BibTeX record conf/icmens/DuvalLSD04
@inproceedings{DBLP:conf/icmens/DuvalLSD04, author = {Olivier Duval and L.{-}P. Lafrance and Yvon Savaria and Patrick Desjardins}, title = {An Integrated Test Platform for Nanostructure Electrical Characterization}, booktitle = {2004 International Conference on MEMS, NANO, and Smart Systems {(ICMENS} 2004), 25-27 August 2004, Banff, Alberta, Canada}, pages = {237--242}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/ICMENS.2004.1508953}, doi = {10.1109/ICMENS.2004.1508953}, timestamp = {Fri, 24 Mar 2023 00:03:40 +0100}, biburl = {https://dblp.org/rec/conf/icmens/DuvalLSD04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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