BibTeX record conf/icm2/ArnaoutGHKKN21

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@inproceedings{DBLP:conf/icm2/ArnaoutGHKKN21,
  author       = {Mohamad Arnaout and
                  Ahmad Ghizzawi and
                  Ali Al{-}Hajj Hassan and
                  Ali Koubayssi and
                  Moussa Kafal and
                  Ziad Noun},
  title        = {The Detection and Classification of Faults by the Use of Machine Learning
                  Technique},
  booktitle    = {International Conference on Microelectronics, {ICM} 2021, New Cairo
                  City, Egypt, December 19-22, 2021},
  pages        = {242--245},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/ICM52667.2021.9664906},
  doi          = {10.1109/ICM52667.2021.9664906},
  timestamp    = {Mon, 05 Jun 2023 17:49:36 +0200},
  biburl       = {https://dblp.org/rec/conf/icm2/ArnaoutGHKKN21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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