BibTeX record conf/icm2/AlhakimTSL15

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@inproceedings{DBLP:conf/icm2/AlhakimTSL15,
  author       = {Rshdee Alhakim and
                  Ghislain Takam Tchendjou and
                  Emmanuel Simeu and
                  Fritz Lebowsky},
  title        = {Image quality assessment using nonlinear learning methods},
  booktitle    = {27th International Conference on Microelectronics, {ICM} 2015, Casablanca,
                  Morocco, December 20-23, 2015},
  pages        = {5--8},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/ICM.2015.7437973},
  doi          = {10.1109/ICM.2015.7437973},
  timestamp    = {Mon, 09 Aug 2021 14:54:02 +0200},
  biburl       = {https://dblp.org/rec/conf/icm2/AlhakimTSL15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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