BibTeX record conf/ickii/LinZZCCWW20

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@inproceedings{DBLP:conf/ickii/LinZZCCWW20,
  author       = {Yu{-}Chen Lin and
                  Kai{-}Chun Zhan and
                  Ji{-}Min Zhang and
                  Jian{-}Ming Chen and
                  Cheng{-}Hsun{-}Tony Chang and
                  Shea{-}Jue Wang and
                  Mu{-}Chun Wang},
  title        = {Junction Integrity for 28nm High-k nMOSFETs with Thermal Stress},
  booktitle    = {3rd {IEEE} International Conference on Knowledge Innovation and Invention,
                  {ICKII} 2020, Kaohsiung, Taiwan, August 21-23, 2020},
  pages        = {64--66},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/ICKII50300.2020.9318948},
  doi          = {10.1109/ICKII50300.2020.9318948},
  timestamp    = {Sun, 02 Oct 2022 16:05:31 +0200},
  biburl       = {https://dblp.org/rec/conf/ickii/LinZZCCWW20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}