@inproceedings{DBLP:conf/icip/ZervakisGR02,
  author    = {Michael E. Zervakis and
               Stefanos Goumas and
               George A. Rovithakis},
  title     = {A Bayesian image analysis framework for post placement quality
               inspection of components},
  booktitle = {ICIP (2)},
  year      = {2002},
  pages     = {549-552},
  ee        = {http://dx.doi.org/10.1109/ICIP.2002.1040009},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}