BibTeX record conf/icip/CaiPXW0ZF22

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@inproceedings{DBLP:conf/icip/CaiPXW0ZF22,
  author       = {Lile Cai and
                  Ramanpreet Singh Pahwa and
                  Xun Xu and
                  Jie Wang and
                  Richard Chang and
                  Lining Zhang and
                  Chuan{-}Sheng Foo},
  title        = {Exploring Active Learning for Semiconductor Defect Segmentation},
  booktitle    = {2022 {IEEE} International Conference on Image Processing, {ICIP} 2022,
                  Bordeaux, France, 16-19 October 2022},
  pages        = {1796--1800},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ICIP46576.2022.9897842},
  doi          = {10.1109/ICIP46576.2022.9897842},
  timestamp    = {Thu, 06 Jul 2023 13:29:13 +0200},
  biburl       = {https://dblp.org/rec/conf/icip/CaiPXW0ZF22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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