BibTeX record conf/iciis/KunduCM08

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@inproceedings{DBLP:conf/iciis/KunduCM08,
  author       = {Subhadip Kundu and
                  Santanu Chattopadhyay and
                  Kanchan Manna},
  title        = {A Novel Technique to Reduce both Leakage and Peak Power during Scan
                  Testing},
  booktitle    = {{IEEE} Reglon 10 Colloquium and Third International Conference on
                  Industrial and Information Systems, {ICIIS} 2008, Kharagpur, India,
                  December 8-10, 2008},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2008},
  url          = {https://doi.org/10.1109/ICIINFS.2008.4798402},
  doi          = {10.1109/ICIINFS.2008.4798402},
  timestamp    = {Fri, 13 Aug 2021 09:26:01 +0200},
  biburl       = {https://dblp.org/rec/conf/iciis/KunduCM08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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