BibTeX record conf/icicdt/ZhangJDZZ19

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@inproceedings{DBLP:conf/icicdt/ZhangJDZZ19,
  author       = {Jian Fu Zhang and
                  Zhigang Ji and
                  Meng Duan and
                  Wei Dong Zhang and
                  Cezhou Zhao},
  title        = {Voltage step stress: a technique for reducing test time of device
                  ageing},
  booktitle    = {International Conference on {IC} Design and Technology, {ICICDT} 2019,
                  Suzhou, China, June 17-19, 2019},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/ICICDT.2019.8790938},
  doi          = {10.1109/ICICDT.2019.8790938},
  timestamp    = {Fri, 22 Apr 2022 14:23:22 +0200},
  biburl       = {https://dblp.org/rec/conf/icicdt/ZhangJDZZ19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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